IC

Ing-Shin Chen

AC Advanced Technology & Materials Co.: 11 patents #42 of 410Top 15%
EN Entegris: 2 patents #263 of 643Top 45%
Overall (All Time): #348,100 of 4,157,543Top 9%
14
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
10288456 Fluid monitoring apparatus Thomas H. Baum, Richard Chism 2019-05-14
9134146 Fluid monitoring apparatus Thomas H. Baum, Richard Chism 2015-09-15
8109130 Apparatus and process for sensing fluoro species in semiconductor processing systems Frank Dimeo, Jr., Philip S. H. Chen, Jeffrey W. Neuner, James Welch, Michele Stawasz +3 more 2012-02-07
7655887 Feedback control system and method for maintaining constant resistance operation of electrically heated elements Jeffrey W. Neuner, Richard Kramer 2010-02-02
7475588 Apparatus and process for sensing fluoro species in semiconductor processing systems Frank Dimeo, Jr., Philip S. H. Chen, Jeffrey W. Neuner, James Welch, Michele Stawacz +3 more 2009-01-13
7370511 Gas sensor with attenuated drift characteristic Frank Dimeo, Jr., Philip S. H. Chen, Jeffrey W. Neuner, James Welch, Bryan C. Hendrix 2008-05-13
7296460 Apparatus and process for sensing fluoro species in semiconductor processing systems Frank Dimeo, Jr., Philip S. H. Chen, Jeffrey W. Neuner, James Welch, Michele Stawasz +3 more 2007-11-20
7296458 Nickel-coated free-standing silicon carbide structure for sensing fluoro or halogen species in semiconductor processing systems, and processes of making and using same Frank Dimeo, Jr., Philip S. H. Chen, Jeffrey W. Neuner, James Welch 2007-11-20
7228724 Apparatus and process for sensing target gas species in semiconductor processing systems Philip S. H. Chen, Frank Dimeo, Jr., Jeffrey W. Neuner, James Welch, Jeffrey F. Roeder 2007-06-12
7193187 Feedback control system and method for maintaining constant resistance operation of electrically heated elements Jeffrey W. Neuner 2007-03-20
7080545 Apparatus and process for sensing fluoro species in semiconductor processing systems Frank Dimeo, Jr., Philip S. H. Chen, Jeffrey W. Neuner, James Welch, Michele Stawasz +3 more 2006-07-25
6900498 Barrier structures for integration of high K oxides with Cu and Al electrodes Gregory T. Stauf, Bryan C. Hendrix, Jeffrey F. Roeder 2005-05-31
6692569 A-SITE-AND/OR B-SITE-MODIFIED PBZRTIO3 MATERIALS AND (PB, SR, CA, BA, MG) (ZR, TI,NB, TA)O3 FILMS HAVING UTILITY IN FERROELECTRIC RANDOM ACCESS MEMORIES AND HIGH PERFORMANCE THIN FILM MICROACTUATORS Jeffrey F. Roeder, Steven M. Bilodeau, Thomas H. Baum 2004-02-17
6312816 A-site- and/or B-site-modified PbZrTiO3 materials and (Pb, Sr, Ca, Ba, Mg) (Zr, Ti, Nb, Ta)O3 films having utility in ferroelectric random access memories and high performance thin film microactuators Jeffrey F. Roeder, Steven M. Bilodeau, Thomas H. Baum 2001-11-06