Issued Patents 2025
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12394655 | Subsurface alignment metrology system for packaging applications | Venkatakaushik Voleti, Keith Wells | 2025-08-19 |
| 12288350 | Image based metrology of surface deformations | Guoheng Zhao | 2025-04-29 |
| 12276490 | System and method to map thickness variations of substrates in manufacturing systems | Todd Egan, Gopalakrishna B. Prabhu | 2025-04-15 |
| 12222659 | Metrology system for packaging applications | Venkatakaushik Voleti | 2025-02-11 |
| 12211717 | Spatial pattern loading measurement with imaging metrology | Eric Ng, Edward W. Budiarto, Todd Egan, Venkatakaushik Voleti | 2025-01-28 |