Issued Patents 2025
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12394655 | Subsurface alignment metrology system for packaging applications | Keith Wells, Mehdi Vaez-Iravani | 2025-08-19 |
| 12222659 | Metrology system for packaging applications | Mehdi Vaez-Iravani | 2025-02-11 |
| 12211717 | Spatial pattern loading measurement with imaging metrology | Eric Ng, Edward W. Budiarto, Mehdi Vaez-Iravani, Todd Egan | 2025-01-28 |