Issued Patents 2025
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12211717 | Spatial pattern loading measurement with imaging metrology | Edward W. Budiarto, Mehdi Vaez-Iravani, Todd Egan, Venkatakaushik Voleti | 2025-01-28 |
EN
Eric Ng
Overall (2025): #394,355 of 469,880Top 85%
1
Patents 2025