Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12211717 | Spatial pattern loading measurement with imaging metrology | Eric Ng, Mehdi Vaez-Iravani, Todd Egan, Venkatakaushik Voleti | 2025-01-28 |
EB
Edward W. Budiarto
Overall (2025): #399,336 of 469,880Top 85%
1
Patents 2025