Issued Patents 2025
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12276490 | System and method to map thickness variations of substrates in manufacturing systems | Mehdi Vaez-Iravani, Todd Egan | 2025-04-15 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12276490 | System and method to map thickness variations of substrates in manufacturing systems | Mehdi Vaez-Iravani, Todd Egan | 2025-04-15 |