Issued Patents 2025
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12430206 | Temperature sensor management during error handling operations in a memory sub-system | Steven Michael Kientz, Hyungseok Kim, Zixiang Loh, Jun Wan | 2025-09-30 |
| 12431202 | Memory read calibration based on memory device-originated metrics characterizing voltage distributions | Dung Viet Nguyen, Zhengang Chen, Shantilal Rayshi Doru, Hope Henry | 2025-09-30 |
| 12424287 | Memory read voltage threshold tracking based on memory device-originated metrics characterizing voltage distributions | Shantilal Rayshi Doru, Steven Michael Kientz, Sampath K. Ratnam, Dung Viet Nguyen | 2025-09-23 |
| 12412632 | Managing compensation for charge coupling and lateral migration in memory devices | Mustafa N. Kaynak, Sivagnanam Parthasarathy | 2025-09-09 |
| 12373109 | Validating read level voltage in memory devices | Jeffrey S. McNeil, Eric N. Lee, Vamsi Pavan Rayaprolu, Sivagnanam Parthasarathy, Kishore Kumar Muchherla +1 more | 2025-07-29 |
| 12354670 | Dynamic adjustment of offset voltages for reading memory cells in a memory device | Mustafa N. Kaynak, Sivagnanam Parthasarathy | 2025-07-08 |
| 12332742 | Memory compaction management in memory devices | Vamsi Pavan Rayaprolu, Mustafa N. Kaynak, Sivagnanam Parthasarathy, Sampath K. Ratnam, Kishore Kumar Muchherla +2 more | 2025-06-17 |
| 12327048 | Using duplicate data for improving error correction capability | Jeffrey S. McNeil, Kishore Kumar Muchherla, Sivagnanam Parthasarathy, Sundararajan Sankaranarayanan, Jeremy Binfet +1 more | 2025-06-10 |
| 12266420 | Temperature-compensated time estimate for a block to reach a uniform charge loss state | Steven Michael Kientz, Sivagnanam Parthasarathy, Mustafa N. Kaynak, Vamsi Pavan Rayaprolu | 2025-04-01 |
| 12223190 | Measurement of representative charge loss in a block to determine charge loss state | Steven Michael Kientz, Sivagnanam Parthasarathy, Mustafa N. Kaynak, Vamsi Pavan Rayaprolu | 2025-02-11 |
| 12217803 | Determine optimized read voltage via identification of distribution shape of signal and noise characteristics | AbdelHakim S. Alhussien, James Fitzpatrick, Sivagnanam Parthasarathy | 2025-02-04 |
| 12197742 | Managing error compensation using charge coupling and lateral migration sensitivity | Mustafa N. Kaynak, Sivagnanam Parthasarathy | 2025-01-14 |