| 12431205 |
Adaptive calibration for threshold voltage offset bins |
Vamsi Pavan Rayaprolu |
2025-09-30 |
| 12430206 |
Temperature sensor management during error handling operations in a memory sub-system |
Hyungseok Kim, Zixiang Loh, Patrick R. Khayat, Jun Wan |
2025-09-30 |
| 12423013 |
Open block family duration limited by temperature variation |
Michael Sheperek, Larry J. Koudele, Bruce A. Liikanen |
2025-09-23 |
| 12424287 |
Memory read voltage threshold tracking based on memory device-originated metrics characterizing voltage distributions |
Shantilal Rayshi Doru, Patrick R. Khayat, Sampath K. Ratnam, Dung Viet Nguyen |
2025-09-23 |
| 12353771 |
Charge loss mitigation throughout memory device lifecycle by proactive window shift |
Ugo Russo, Vamsi Pavan Rayaprolu |
2025-07-08 |
| 12322473 |
Determining read voltage offset in memory devices |
Robert W. Mason, Pitamber Shukla |
2025-06-03 |
| 12307111 |
Block family-based error avoidance for memory devices |
Michael Sheperek, Kishore Kumar Muchherla, Mustafa N. Kaynak, Vamsi Pavan Rayaprolu, Bruce A. Liikanen +3 more |
2025-05-20 |
| 12293099 |
Open block family duration limited by time and temperature |
Michael Sheperek, Larry J. Koudele, Bruce A. Liikanen, Kishore Kumar Muchherla |
2025-05-06 |
| 12266420 |
Temperature-compensated time estimate for a block to reach a uniform charge loss state |
Patrick R. Khayat, Sivagnanam Parthasarathy, Mustafa N. Kaynak, Vamsi Pavan Rayaprolu |
2025-04-01 |
| 12223190 |
Measurement of representative charge loss in a block to determine charge loss state |
Patrick R. Khayat, Sivagnanam Parthasarathy, Mustafa N. Kaynak, Vamsi Pavan Rayaprolu |
2025-02-11 |
| 12210759 |
Threshold voltage bin calibration at memory device power up |
Chia-Yu Kuo |
2025-01-28 |
