Issued Patents 2025
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12431205 | Adaptive calibration for threshold voltage offset bins | Steven Michael Kientz | 2025-09-30 |
| 12430052 | Data age and validity-based memory management | Ashutosh Malshe, Kishore Kumar Muchherla | 2025-09-30 |
| 12373109 | Validating read level voltage in memory devices | Jeffrey S. McNeil, Eric N. Lee, Sivagnanam Parthasarathy, Kishore Kumar Muchherla, Patrick R. Khayat +1 more | 2025-07-29 |
| 12353753 | Diagonal page mapping in memory systems | Tawalin Opastrakoon, Renato C. Padilla, Michael G. Miller, Christopher M. Smitchger, Gary F. Besinga +1 more | 2025-07-08 |
| 12353771 | Charge loss mitigation throughout memory device lifecycle by proactive window shift | Steven Michael Kientz, Ugo Russo | 2025-07-08 |
| 12340095 | Management of error-handling flows in memory devices using probability data structure | Aswin Thiruvengadam | 2025-06-24 |
| 12334166 | Data integrity checks based on voltage distribution metrics | Michael Sheperek, Christopher M. Smitchger | 2025-06-17 |
| 12332742 | Memory compaction management in memory devices | Mustafa N. Kaynak, Sivagnanam Parthasarathy, Patrick R. Khayat, Sampath K. Ratnam, Kishore Kumar Muchherla +2 more | 2025-06-17 |
| 12307111 | Block family-based error avoidance for memory devices | Michael Sheperek, Kishore Kumar Muchherla, Mustafa N. Kaynak, Bruce A. Liikanen, Peter Feeley +3 more | 2025-05-20 |
| 12287982 | Host data storage scan data retention rating | Thomas Lentz | 2025-04-29 |
| 12272412 | Performing selective copyback in memory devices | Ashutosh Malshe, Gary F. Besinga, Roy Leonard | 2025-04-08 |
| 12266420 | Temperature-compensated time estimate for a block to reach a uniform charge loss state | Patrick R. Khayat, Steven Michael Kientz, Sivagnanam Parthasarathy, Mustafa N. Kaynak | 2025-04-01 |
| 12230315 | Model for predicting memory system performance | Aswin Thiruvengadam | 2025-02-18 |
| 12223190 | Measurement of representative charge loss in a block to determine charge loss state | Patrick R. Khayat, Steven Michael Kientz, Sivagnanam Parthasarathy, Mustafa N. Kaynak | 2025-02-11 |