| 12412616 |
Probabilistic data integrity scans using risk factor estimation |
Robert W. Mason, Phani Raghavendra Yasasvi Gangavarapu, Qun Su |
2025-09-09 |
| 12387795 |
Low stress refresh erase in a memory device |
Ronit Roneel Prakash, Ching-Huang Lu, Murong Lang, Zhenming Zhou |
2025-08-12 |
| 12322451 |
Memory systems with flexible erase suspend-resume operations, and associated systems, devices, and methods |
Jiun-Horng Lai, Ching-Huang Lu, Fulvio Rori, Wai Ying Lo, Scott Anthony Stoller |
2025-06-03 |
| 12322473 |
Determining read voltage offset in memory devices |
Robert W. Mason, Steven Michael Kientz |
2025-06-03 |
| 12293795 |
Managing defective blocks during multi-plane programming operations in memory devices |
Robert W. Mason, Scott Anthony Stoller, Ekamdeep Singh |
2025-05-06 |
| 12229024 |
Memory system failure detection and self recovery of memory dice |
Robert W. Mason, Scott Anthony Stoller, Kenneth W. Marr, Chi Ming Chu, Hossein Afkhami |
2025-02-18 |
