Issued Patents 2025
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12422377 | Defect inspection apparatus and defect inspection method | Takanori Kondo, Nobuhiro Obara, Masami Makuuchi | 2025-09-23 |
| 12400889 | Defect inspection device | Hiromichi Yamakawa, Yuta Urano, Shunichi Matsumoto, Masaya Yamamoto, Eiji Arima | 2025-08-26 |
| 12366443 | Surface inspection device and shape measurement software | Takeru UTSUGI | 2025-07-22 |
| 12366538 | Defect inspection apparatus and defect inspection method | Yuta Urano, Eiji Arima, Hiromichi Yamakawa, Shunichi Matsumoto, Hisaaki Kanai | 2025-07-22 |
| 12345654 | Defect inspection device, defect inspection method, and adjustment substrate | Yuta Urano, Eiji Arima, Hiromichi Yamakawa | 2025-07-01 |
| 12345661 | Defect inspection apparatus and defect inspection method | Shunichi Matsumoto, Nobuhiro Obara | 2025-07-01 |
| 12313566 | Defect inspection device and defect inspection method | Yuta Urano, Shunichi Matsumoto, Hisaaki Kanai | 2025-05-27 |
| 12292389 | Defect inspection apparatus | — | 2025-05-06 |
| 12196673 | Defect inspection apparatus and defect inspection method | Takeru UTSUGI, Andreas Karsaklian Dal Bosco, Tomoto Kawamura, Kenshiro OHTSUBO | 2025-01-14 |