Issued Patents 2025
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12400889 | Defect inspection device | Hiromichi Yamakawa, Toshifumi Honda, Yuta Urano, Shunichi Matsumoto, Masaya Yamamoto | 2025-08-26 |
| 12366538 | Defect inspection apparatus and defect inspection method | Toshifumi Honda, Yuta Urano, Hiromichi Yamakawa, Shunichi Matsumoto, Hisaaki Kanai | 2025-07-22 |
| 12345654 | Defect inspection device, defect inspection method, and adjustment substrate | Yuta Urano, Hiromichi Yamakawa, Toshifumi Honda | 2025-07-01 |