Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12366538 | Defect inspection apparatus and defect inspection method | Toshifumi Honda, Yuta Urano, Eiji Arima, Hiromichi Yamakawa, Shunichi Matsumoto | 2025-07-22 |
| 12313566 | Defect inspection device and defect inspection method | Toshifumi Honda, Yuta Urano, Shunichi Matsumoto | 2025-05-27 |