Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12422377 | Defect inspection apparatus and defect inspection method | Toshifumi Honda, Nobuhiro Obara, Masami Makuuchi | 2025-09-23 |
| 12235223 | Method for defect inspection, system, and computer-readable medium | Nobuhiro Obara, Takahiro Urano | 2025-02-25 |