Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12422377 | Defect inspection apparatus and defect inspection method | Toshifumi Honda, Takanori Kondo, Nobuhiro Obara | 2025-09-23 |
| 12276618 | Defect inspection device | Kazuhide Sato, Yukihisa Mohara | 2025-04-15 |