Issued Patents 2025
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12422377 | Defect inspection apparatus and defect inspection method | Toshifumi Honda, Takanori Kondo, Masami Makuuchi | 2025-09-23 |
| 12345661 | Defect inspection apparatus and defect inspection method | Toshifumi Honda, Shunichi Matsumoto | 2025-07-01 |
| 12235223 | Method for defect inspection, system, and computer-readable medium | Takanori Kondo, Takahiro Urano | 2025-02-25 |