Issued Patents 2024
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12068207 | Simultaneous multi-bandwidth optical inspection of semiconductor devices | Shih-Chang Wang, Hsiu-Hui Huang, Hung-Yi Chung, Chien-Huei Chen | 2024-08-20 |
| 11994902 | Liquid crystal display comprising a light channel formed through a stack including at least a color film layer, a thin-film-transistor layer, and a backlight and electronic device having the same | Bangshi Yin, Fan Yang, Bin Yan, Kangle Xue | 2024-05-28 |
| 11984365 | Semiconductor structure inspection using a high atomic number material | Pei-Hsuan Lee, Hung-Ming Chen, Kuang-Shing Chen, Yu-Hsiang Cheng | 2024-05-14 |
| 11900586 | Hot spot defect detecting method and hot spot defect detecting system | Chien-Huei Chen, Pei-Chao Su, Chan-Ming Chang, Shih-Yung Chen, Hung-Yi Chung +6 more | 2024-02-13 |
| 11894408 | Dual facing BSI image sensors with wafer level stacking | Ping-Yin Liu, Yeur-Luen Tu, Chia-Shiung Tsai, Pin-Nan Tseng | 2024-02-06 |