Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12068207 | Simultaneous multi-bandwidth optical inspection of semiconductor devices | Shih-Chang Wang, Hsiu-Hui Huang, Chien-Huei Chen, Xiaomeng Chen | 2024-08-20 |
| 11900586 | Hot spot defect detecting method and hot spot defect detecting system | Chien-Huei Chen, Pei-Chao Su, Xiaomeng Chen, Chan-Ming Chang, Shih-Yung Chen +6 more | 2024-02-13 |