Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11984365 | Semiconductor structure inspection using a high atomic number material | Pei-Hsuan Lee, Hung-Ming Chen, Yu-Hsiang Cheng, Xiaomeng Chen | 2024-05-14 |
| 11900586 | Hot spot defect detecting method and hot spot defect detecting system | Chien-Huei Chen, Pei-Chao Su, Xiaomeng Chen, Chan-Ming Chang, Shih-Yung Chen +6 more | 2024-02-13 |