Kaustuve Bhattacharyya

Issued Patents 2024

Showing 1–7 of 7 patents

Patent #	Title	Co-Inventors	Date
12158435	Illumination and detection apparatus for a metrology apparatus	Nitesh Pandey, Simon Gijsbert Josephus Mathijssen, Arie Jeffrey Den Boef	2024-12-03
12130246	Method for overlay metrology and apparatus thereof	Simon Gijsbert Josephus Mathijssen, Arie Jeffrey Den Boef	2024-10-29
12061421	Method and system for determining information about a target structure	Arie Jeffrey Den Boef, Keng-Fu Chang, Simon Gijsbert Josephus Mathijssen	2024-08-13
12032299	Metrology method and associated metrology and lithographic apparatuses	Patricius Aloysius Jacobus Tinnemans, Igor Matheus Petronella Aarts, Ralph Brinkhof, Leendert Jan KARSSEMEIJER, Stefan Carolus Jacobus Antonius Keij +4 more	2024-07-09
12032297	Method for monitoring lithographic apparatus	Emil Peter Schmitt-Weaver, Martin Kers	2024-07-09
12013647	Metrology method	Simon Gijsbert Josephus Mathijssen, Marc Johannes Noot, Arie Jeffrey Den Boef, Grzegorz Grzela, Timothy Dugan Davis +4 more	2024-06-18
11886125	Method for inferring a local uniformity metric	Simon Gijsbert Josephus Mathijssen	2024-01-30