Issued Patents 2024
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12148647 | Integrated substrate measurement system | Patricia A. Schulze, Gregory John Freeman, Michael Kutney, Arunkumar Ramachandraiah, Chih Chung Chou +1 more | 2024-11-19 |
| D1045923 | Portion of a display panel with a graphical user interface | Sidharth Bhatia, Jeffrey Yat Shan Au, Shawn Levesque, Michael David Howells, Raja Sekhar Jetti | 2024-10-08 |
| D1045924 | Portion of a display panel with a graphical user interface | Sidharth Bhatia, Jeffrey Yat Shan Au, Shawn Levesque, Michael David Howells, Raja Sekhar Jetti | 2024-10-08 |
| 12031910 | Transmission corrected plasma emission using in-situ optical reflectometry | Patrick Tae, Blake Erickson, Chunlei Zhang | 2024-07-09 |
| D1031743 | Portion of a display panel with a graphical user interface | Sidharth Bhatia, Jeffrey Yat Shan Au, Shawn Levesque, Michael David Howells, Raja Sekhar Jetti | 2024-06-18 |
| 12009191 | Thin film, in-situ measurement through transparent crystal and transparent substrate within processing chamber wall | Patrick Tae, Blake Erickson, Michael D. Willwerth, Barry Craver | 2024-06-11 |
| 11927543 | Multiple reflectometry for measuring etch parameters | Blake Erickson, Keith R. Berding, Michael Kutney, Soumendra N. Barman, Michelle SanPedro +1 more | 2024-03-12 |