LK

Larry J. Koudele

Micron: 26 patents #27 of 1,593Top 2%
📍 Erie, CO: #1 of 99 inventorsTop 2%
🗺 Colorado: #8 of 5,391 inventorsTop 1%
Overall (2023): #1,136 of 537,848Top 1%
26
Patents 2023

Issued Patents 2023

Showing 1–25 of 26 patents

Patent #TitleCo-InventorsDate
11853556 Combining sets of memory blocks in a memory device Steven Michael Kientz, Shane Nowell, Michael Sheperek, Bruce A. Liikanen 2023-12-26
11842061 Open block family duration limited by temperature variation Michael Sheperek, Bruce A. Liikanen, Steven Michael Kientz 2023-12-12
11837291 Voltage offset bin selection by die group for memory devices Vamsi Pavan Rayaprolu, Mustafa N. Kaynak, Michael Sheperek, Shane Nowell 2023-12-05
11817152 Generating embedded data in memory cells in a memory sub-system Bruce A. Liikanen, Michael Sheperek 2023-11-14
11789640 Estimation of read level thresholds using a data structure Michael Sheperek, Bruce A. Liikanen 2023-10-17
11755478 Block family combination and voltage bin selection Michael Sheperek, Mustafa N. Kaynak, Shane Nowell 2023-09-12
11742027 Dynamic program erase targeting with bit error rate Bruce A. Liikanen, Michael Sheperek 2023-08-29
11735254 Error avoidance based on voltage distribution parameters of blocks Shane Nowell, Steven Michael Kientz, Michael Sheperek, Mustafa N. Kaynak, Kishore Kumar Muchherla +1 more 2023-08-22
11733929 Memory system with dynamic calibration using a variable adjustment mechanism Michael Sheperek, Steve Kientz 2023-08-22
11727994 Performing threshold voltage offset bin selection by package for memory devices Michael Sheperek, Kishore Kumar Muchherla, Mustafa N. Kaynak, Vamsi Pavan Rayaprolu, Bruce A. Liikanen 2023-08-15
11721399 Memory system with dynamic calibration using a trim management mechanism Michael Sheperek, Steve Kientz 2023-08-08
11714580 Dynamic background scan optimization in a memory sub-system Gerald L. Cadloni, Michael Sheperek, Francis Chew, Bruce A. Liikanen 2023-08-01
11714710 Providing data of a memory system based on an adjustable error rate Mustafa N. Kaynak, Michael Sheperek, Patrick R. Khayat, Sampath K. Ratnam 2023-08-01
11705208 Read level calibration in memory devices using embedded servo cells Bruce A. Liikanen, Michael Sheperek 2023-07-18
11705193 Error avoidance based on voltage distribution parameters Shane Nowell, Steven Michael Kientz, Michael Sheperek, Mustafa N. Kaynak, Kishore Kumar Muchherla +1 more 2023-07-18
11704217 Charge loss scan operation management in memory devices Michael Sheperek, Steven Michael Kientz, Shane Nowell, Mustafa N. Kaynak, Kishore Kumar Muchherla 2023-07-18
11675509 Multiple open block families supporting multiple cursors of a memory device Shane Nowell, Michael Sheperek, Bruce A. Liikanen, Steve Kientz 2023-06-13
11675511 Associating multiple cursors with block family of memory device Michael Sheperek, Bruce A. Liikanen, Peter Feeley, Shane Nowell, Steven Michael Kientz 2023-06-13
11669398 Memory components with ordered sweep error recovery Gerald L. Cadloni, Bruce A. Liikanen, Francis Chew 2023-06-06
11669380 Dynamic programming of page margins Michael Sheperek, Bruce A. Liikanen 2023-06-06
11651828 First-pass dynamic program targeting (DPT) Michael Sheperek, Bruce A. Liikanen 2023-05-16
11625177 Combination scan management for block families of a memory device Shane Nowell, Michael Sheperek, Vamsi Pavan Rayaprolu 2023-04-11
11609706 Read sample offset placement Michael Sheperek, Bruce A. Liikanen 2023-03-21
11600333 Adjustment of a voltage corresponding to a programming distribution based on a program targeting rule Bruce A. Liikanen, Michael Sheperek 2023-03-07
11573720 Open block family duration limited by time and temperature Michael Sheperek, Bruce A. Liikanen, Steven Michael Kientz, Kishore Kumar Muchherla 2023-02-07