ZC

Zhongwei Chen

AB Asml Netherlands B.V.: 8 patents #6 of 696Top 1%
BP Borries Pte.: 5 patents #1 of 5Top 20%
Overall (2023): #3,359 of 537,848Top 1%
15
Patents 2023

Issued Patents 2023

Showing 1–15 of 15 patents

Patent #TitleCo-InventorsDate
11854762 MEMS sample holder, packaged product thereof, and apparatus of charged-particle beam such as electron microscope using the same Wei FANG, Xiaoming Chen, Daniel Tang, Liang-Fu Fan 2023-12-26
11854763 Backscattered electron detector, apparatus of charged-particle beam such as electron microscope comprising the same, and method thereof Wei FANG, Xiaoming Chen, Daniel Tang, Liang-Fu Fan 2023-12-26
11848169 Field-emission type electron source and charged particle beam device using the same Dazhi Chen 2023-12-19
11837431 Objective lens system for fast scanning large FOV Shuai Li 2023-12-05
11798777 Charged particle beam apparatus, and systems and methods for operating the apparatus Martinus Gerardus Johannes Maria MAASSEN, Peter Paul HEMPENIUS, Weiming Ren 2023-10-24
11784024 Multi-cell detector for charged particles Joe Wang, Yongxin Wang, Xuerang Hu 2023-10-10
11715619 Method and apparatus for charged particle detection Yongxin Wang, Weiming Ren, Zhonghua Dong 2023-08-01
11705304 Apparatus of plural charged-particle beams Shuai Li, Weiming Ren, Xuedong Liu, Juying Dou, Xuerang Hu 2023-07-18
11688580 Apparatus of plural charged-particle beams Xuedong Liu, Weiming Ren, Shuai Li 2023-06-27
11676792 Sample pre-charging methods and apparatuses for charged particle beam inspection Xuedong Liu, Qingpo Xi, Youfei Jiang, Weiming Ren, Xuerang Hu 2023-06-13
11664189 Apparatus of charged-particle beam such as scanning electron microscope comprising plasma generator, and method thereof Xiaoming Chen, Daniel Tang, Liang-Fu Fan 2023-05-30
11664186 Apparatus of electron beam comprising pinnacle limiting plate and method of reducing electron-electron interaction Wei FANG, Xiaoming Chen, Daniel Tang, Liang-Fu Fan 2023-05-30
11593938 Rapid and automatic virus imaging and analysis system as well as methods thereof Xiaoming Chen, Daniel Tang, Liang-Fu Fan 2023-02-28
11587758 Apparatus of plural charged-particle beams Weiming Ren, Xuedong Liu, Xuerang Hu 2023-02-21
11569059 Apparatus of charged-particle beam such as electron microscope comprising plasma generator, and method thereof Xiaoming Chen, Daniel Tang, Liang-Fu Fan 2023-01-31