| 11854762 |
MEMS sample holder, packaged product thereof, and apparatus of charged-particle beam such as electron microscope using the same |
Wei FANG, Xiaoming Chen, Liang-Fu Fan, Zhongwei Chen |
2023-12-26 |
| 11854763 |
Backscattered electron detector, apparatus of charged-particle beam such as electron microscope comprising the same, and method thereof |
Wei FANG, Xiaoming Chen, Liang-Fu Fan, Zhongwei Chen |
2023-12-26 |
| 11664186 |
Apparatus of electron beam comprising pinnacle limiting plate and method of reducing electron-electron interaction |
Zhongwei Chen, Wei FANG, Xiaoming Chen, Liang-Fu Fan |
2023-05-30 |
| 11664189 |
Apparatus of charged-particle beam such as scanning electron microscope comprising plasma generator, and method thereof |
Zhongwei Chen, Xiaoming Chen, Liang-Fu Fan |
2023-05-30 |
| 11593938 |
Rapid and automatic virus imaging and analysis system as well as methods thereof |
Zhongwei Chen, Xiaoming Chen, Liang-Fu Fan |
2023-02-28 |
| 11569059 |
Apparatus of charged-particle beam such as electron microscope comprising plasma generator, and method thereof |
Zhongwei Chen, Xiaoming Chen, Liang-Fu Fan |
2023-01-31 |