Issued Patents 2023
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11822255 | Process window based on defect probability | Abraham SLACHTER, Wim Tjibbo Tel, Anton Bernhard Van Oosten, Koenraad VAN INGEN SCHENAU, Gijsbert Rispens +1 more | 2023-11-21 |
| 11720029 | Method and apparatus for image analysis | Scott Anderson Middlebrooks, Markus Gerardus Martinus Maria Van Kraaij, Adrianus Cornelis Matheus Koopman, Willem Marie Julia Marcel Coene | 2023-08-08 |
| 11681229 | Selection of measurement locations for patterning processes | Hans Van Der Laan, Wim Tjibbo Tel, Marinus Jochemsen | 2023-06-20 |
| 11669020 | Method and apparatus for pattern fidelity control | Tanbir HASAN, Vivek Jain, Bruno La Fontaine | 2023-06-06 |