Issued Patents 2023
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11822255 | Process window based on defect probability | Abraham SLACHTER, Stefan Hunsche, Wim Tjibbo Tel, Anton Bernhard Van Oosten, Gijsbert Rispens +1 more | 2023-11-21 |
| 11768442 | Method of determining control parameters of a device manufacturing process | Wim Tjibbo Tel, Mark John Maslow, Patrick Warnaar, Abraham SLACHTER, Roy ANUNCIADO +3 more | 2023-09-26 |
| 11733606 | Method for performing a manufacturing process and associated apparatuses | Thomas Theeuwes, Pieter J. Woltgens | 2023-08-22 |