Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11720029 | Method and apparatus for image analysis | Scott Anderson Middlebrooks, Adrianus Cornelis Matheus Koopman, Stefan Hunsche, Willem Marie Julia Marcel Coene | 2023-08-08 |
| 11692948 | Inspection apparatus and inspection method | Nitish Kumar, Richard Quintanilha, Konstantin Tsigutkin, Willem Marie Julia Marcel Coene | 2023-07-04 |