Issued Patents 2023
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11830779 | In-situ etch material selectivity detection system | Keith R. Berding, Blake Erickson, Soumendra N. Barman | 2023-11-28 |
| 11688616 | Integrated substrate measurement system to improve manufacturing process performance | Upendra Ummethala, Blake Erickson, Prashanth Kumar, Michael Kutney, Steven Trey Tindel | 2023-06-27 |
| 11668602 | Spatial optical emission spectroscopy for etch uniformity | Blake Erickson, Keith R. Berding, Michael Kutney, Tsung Feng Wu, Michael D. Willwerth +1 more | 2023-06-06 |
| 11619594 | Multiple reflectometry for measuring etch parameters | Blake Erickson, Keith R. Berding, Michael Kutney, Soumendra N. Barman, Michelle SanPedro +1 more | 2023-04-04 |
| D977504 | Portion of a display panel with a graphical user interface | Upendra Ummethala, Blake Erickson, Prashanth Kumar, Michael Kutney, Steven Trey Tindel | 2023-02-07 |