Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11353493 | Data-driven misregistration parameter configuration and measurement system and method | Roie Volkovich, Anna Golotsvan, Raviv Yohanan | 2022-06-07 |
| 11353799 | System and method for error reduction for metrology measurements | Roie Volkovich, Liran Yerushalmi, Anna Golotsvan, Rawi Dirawi, Chen Dror +3 more | 2022-06-07 |