Issued Patents 2022
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11353799 | System and method for error reduction for metrology measurements | Roie Volkovich, Liran Yerushalmi, Anna Golotsvan, Rawi Dirawi, Nir BenDavid +3 more | 2022-06-07 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11353799 | System and method for error reduction for metrology measurements | Roie Volkovich, Liran Yerushalmi, Anna Golotsvan, Rawi Dirawi, Nir BenDavid +3 more | 2022-06-07 |