Issued Patents 2022
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11468553 | System and method for determining type and size of defects on blank reticles | Ramaprasad Kulkarni, Ge Cong | 2022-10-11 |
| 11270430 | Wafer inspection using difference images | Abdurrahman Sezginer, Xiaochun Li, Pavan Kumar, Junqing Huang, Lisheng Gao +2 more | 2022-03-08 |
| 11257207 | Inspection of reticles using machine learning | Abdurrahman Sezginer, Rui-fang Shi | 2022-02-22 |