Issued Patents 2022
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11380518 | Measurement system and method for setting observation conditions of measurement apparatus | Takafumi Miwa, Hirokazu Tamaki, Makoto Sakakibara, Sayaka KURATA, Atsuko Shintani +6 more | 2022-07-05 |
| 11334761 | Information processing system and information processing method | Thantip Krasienapibal, Sayaka KURATA, Yasuhiro Shirasaki | 2022-05-17 |
| 11251011 | Electron microscope | Takashi Ohshima, Hiroyuki Minemura, Yumiko Anzai, Yoichi Ose, Toshihide Agemura | 2022-02-15 |