Issued Patents 2022
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11380518 | Measurement system and method for setting observation conditions of measurement apparatus | Takafumi Miwa, Hirokazu Tamaki, Momoyo Enyama, Makoto Sakakibara, Sayaka KURATA +6 more | 2022-07-05 |
| 11355308 | Charged particle beam device | Natsuki Tsuno, Minami Shouji, Yohei Nakamura, Muneyuki Fukuda | 2022-06-07 |
| 11334761 | Information processing system and information processing method | Thantip Krasienapibal, Sayaka KURATA, Momoyo Enyama | 2022-05-17 |
| 11328897 | Charged particle beam device | Minami Shouji, Natsuki Tsuno, Muneyuki Fukuda, Satoshi Takada | 2022-05-10 |