Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11380514 | Charged particle beam system | — | 2022-07-05 |
| 11380518 | Measurement system and method for setting observation conditions of measurement apparatus | Takafumi Miwa, Momoyo Enyama, Makoto Sakakibara, Sayaka KURATA, Atsuko Shintani +6 more | 2022-07-05 |