Issued Patents 2022
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11398366 | Charged particle beam apparatus | Yohei Nakamura, Natsuki Tsuno, Heita Kimizuka, Muneyuki Fukuda | 2022-07-26 |
| 11398367 | Charged particle beam apparatus | Yohei Nakamura, Natsuki Tsuno, Heita Kimizuka, Muneyuki Fukuda | 2022-07-26 |
| 11380518 | Measurement system and method for setting observation conditions of measurement apparatus | Hirokazu Tamaki, Momoyo Enyama, Makoto Sakakibara, Sayaka KURATA, Atsuko Shintani +6 more | 2022-07-05 |
| 11335535 | Charged particle beam apparatus | Yohei Nakamura, Heita Kimizuka, Natsuki Tsuno, Muneyuki Fukuda | 2022-05-17 |