Issued Patents 2022
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11430106 | Image processing device, image processing method and charged particle microscope | Takeyoshi Ohashi, Masami Ikota, Kazuhisa Hasumi | 2022-08-30 |
| 11380518 | Measurement system and method for setting observation conditions of measurement apparatus | Takafumi Miwa, Hirokazu Tamaki, Momoyo Enyama, Makoto Sakakibara, Sayaka KURATA +6 more | 2022-07-05 |
| 11276551 | Inspection device | Yasunari Sohda, Noritsugu Takahashi, Hikaru Koyama | 2022-03-15 |