Issued Patents 2021
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11156548 | Measurement methodology of advanced nanostructures | Manh Dang Nguyen, Phillip Atkins, Alexander Kuznetsov, Liequan Lee, Natalia Malkova +3 more | 2021-10-26 |
| 11099137 | Visualization of three-dimensional semiconductor structures | Aaron Rosenberg, Jonathan Iloreta, Thaddeus Gerard Dziura, Antonio Arion Gellineau, Yin Xu +5 more | 2021-08-24 |
| 11060846 | Scatterometry based methods and systems for measurement of strain in semiconductor structures | Aaron Rosenberg, Kai-Hsiang Lin, Dawei Hu, Zhengquan Tan | 2021-07-13 |
| 11036898 | Measurement models of nanowire semiconductor structures based on re-useable sub-structures | Alexander Kuznetsov | 2021-06-15 |