Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11145559 | Process monitoring of deep structures with X-ray scatterometry | Antonio Arion Gellineau | 2021-10-12 |
| 11099137 | Visualization of three-dimensional semiconductor structures | Aaron Rosenberg, Jonathan Iloreta, Antonio Arion Gellineau, Yin Xu, Kaiwen Xu +5 more | 2021-08-24 |