Issued Patents 2021
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11151707 | System and method for difference filter and aperture selection using shallow deep learning | Santosh Bhattacharyya, Jacob George, Saravanan Paramasivam | 2021-10-19 |
| 11119060 | Defect location accuracy using shape based grouping guided defect centering | Jagdish Chandra Saraswatula | 2021-09-14 |
| 11114324 | Defect candidate generation for inspection | Erfan Soltanmohammadi, Prasanti Uppaluri, Mohit Jani, Chris Maher | 2021-09-07 |
| 11055840 | Semiconductor hot-spot and process-window discovery combining optical and electron-beam inspection | Ardis Liang, Saravanan Paramasivam, Niveditha Lakshmi Narasimhan, Sandeep Bhagwat | 2021-07-06 |
| 10964013 | System, method for training and applying defect classifiers in wafers having deeply stacked layers | Ankit Jain | 2021-03-30 |
| 10902579 | Creating and tuning a classifier to capture more defects of interest during inspection | Erfan Soltanmohammadi, Tai-Kam Ng, Sang Hyun Lee | 2021-01-26 |