Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11114324 | Defect candidate generation for inspection | Martin Plihal, Prasanti Uppaluri, Mohit Jani, Chris Maher | 2021-09-07 |
| 10902579 | Creating and tuning a classifier to capture more defects of interest during inspection | Martin Plihal, Tai-Kam Ng, Sang Hyun Lee | 2021-01-26 |