Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11055840 | Semiconductor hot-spot and process-window discovery combining optical and electron-beam inspection | Martin Plihal, Saravanan Paramasivam, Niveditha Lakshmi Narasimhan, Sandeep Bhagwat | 2021-07-06 |