Issued Patents 2021
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11151707 | System and method for difference filter and aperture selection using shallow deep learning | Jacob George, Saravanan Paramasivam, Martin Plihal | 2021-10-19 |
| 11047806 | Defect discovery and recipe optimization for inspection of three-dimensional semiconductor structures | Devashish Sharma, Christopher Maher, Bo Hua, Philip Measor, Robert M. Danen | 2021-06-29 |
| 11049745 | Defect-location determination using correction loop for pixel alignment | David Dowling, Tarunark Singh, Bjorn Brauer, Bryant Mantiply, Hucheng Lee +2 more | 2021-06-29 |