Issued Patents 2021
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11204332 | Repeater defect detection | Eugene Shifrin, Sumit Sen, Ashok Mathew, Sreeram Chandrasekaran, Lisheng Gao | 2021-12-21 |
| 11151711 | Cross layer common-unique analysis for nuisance filtering | — | 2021-10-19 |
| 11120546 | Unsupervised learning-based reference selection for enhanced defect inspection sensitivity | Nurmohammed Patwary, Sangbong Park, Xiaochun Li | 2021-09-14 |
| 11113827 | Pattern-to-design alignment for one-dimensional unique structures | — | 2021-09-07 |
| 11049745 | Defect-location determination using correction loop for pixel alignment | David Dowling, Tarunark Singh, Santosh Bhattacharyya, Bryant Mantiply, Hucheng Lee +2 more | 2021-06-29 |
| 11010885 | Optical-mode selection for multi-mode semiconductor inspection | Richard Wallingford, Kedar Grama, Hucheng Lee, Sangbong Park | 2021-05-18 |
| 10964016 | Combining simulation and optical microscopy to determine inspection mode | — | 2021-03-30 |
| 10957035 | Defect classification by fitting optical signals to a point-spread function | Soren Konecky | 2021-03-23 |
| 10922808 | File selection for test image to design alignment | — | 2021-02-16 |