Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11120546 | Unsupervised learning-based reference selection for enhanced defect inspection sensitivity | Bjorn Brauer, Nurmohammed Patwary, Xiaochun Li | 2021-09-14 |
| 11049745 | Defect-location determination using correction loop for pixel alignment | David Dowling, Tarunark Singh, Bjorn Brauer, Santosh Bhattacharyya, Bryant Mantiply +2 more | 2021-06-29 |
| 11010885 | Optical-mode selection for multi-mode semiconductor inspection | Bjorn Brauer, Richard Wallingford, Kedar Grama, Hucheng Lee | 2021-05-18 |