Issued Patents 2021
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10964013 | System, method for training and applying defect classifiers in wafers having deeply stacked layers | Martin Plihal | 2021-03-30 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10964013 | System, method for training and applying defect classifiers in wafers having deeply stacked layers | Martin Plihal | 2021-03-30 |