Issued Patents 2021
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11158548 | Overlay measurement using multiple wavelengths | Yuval Lamhot, Einat Peled, Noga Sella, Wei-Te Cheng, Ido Adam | 2021-10-26 |
| 11119417 | Single cell grey scatterometry overlay targets and their measurement using varying illumination parameter(s) | Amnon Manassen, Yuri Paskover | 2021-09-14 |
| 11085754 | Enhancing metrology target information content | Amnon Manassen, Nadav Gutman | 2021-08-10 |
| 11067904 | System for combined imaging and scatterometry metrology | Raviv Yohanan | 2021-07-20 |
| 11060845 | Polarization measurements of metrology targets and corresponding target designs | Barry Loevsky, Andrew V. Hill, Amnon Manassen, Nuriel Amir, Vladimir Levinski +1 more | 2021-07-13 |
| 11054752 | Device metrology targets and methods | Daniel Kandel, Dror Alumot, Amit Shaked, Liran Yerushalmi | 2021-07-06 |
| 11006860 | Method and apparatus for gait analysis | Shai Rosenblit, Amir Zviran, Steve Barrett, Moran Gad | 2021-05-18 |