Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11054752 | Device metrology targets and methods | Eran Amit, Daniel Kandel, Amit Shaked, Liran Yerushalmi | 2021-07-06 |
| 11022566 | Examination of a semiconductor specimen | Shalom Elkayam, Shaul Cohen | 2021-06-01 |