Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10818509 | Method of fabricating semiconductor device with reduced trench distortions | Yung-Sung Yen, Chung-Ju Lee, Chun-Kuang Chen, Chia-Tien Wu, Kuei-Shun Chen +4 more | 2020-10-27 |
| 10795270 | Methods of defect inspection | Shih-Che Wang, Shu-Hao Chang, Yi-Hao Chen, Chen-Yen Kao, Te-Chih Huang +1 more | 2020-10-06 |