Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10795270 | Methods of defect inspection | Ta-Ching Yu, Shu-Hao Chang, Yi-Hao Chen, Chen-Yen Kao, Te-Chih Huang +1 more | 2020-10-06 |
| 10558120 | System and method for supplying and dispensing bubble-free photolithography chemical solutions | Wen-Zhan Zhou, Heng-Jen Lee, Hsu-Yuan Liu, Yu-Chen Huang, Cheng-Han Wu +1 more | 2020-02-11 |