Issued Patents 2020
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10876976 | Apparatus and method for substrate inspection | Bo-Han Shih, Hsu-Shui Liu, Jiun-Rong Pai, Shou-Wen Kuo | 2020-12-29 |
| 10872794 | Automatic in-line inspection system | Chien-Ko Liao, Hsu-Shui Liu, Jiun-Rong Pai, Shou-Wen Kuo, Ya Hsun Hsueh | 2020-12-22 |
| 10852704 | Semiconductor equipment management method, electronic device, and non-transitory computer readable storage medium | Sing-Tsung Li, Hsu-Shui Liu, Jiun-Rong Pai, Shou-Wen Kuo, Chien-Ko Liao | 2020-12-01 |
| 10839507 | Defect offset correction | Chien-Ko Liao, Ya Hsun Hsueh, Hsu-Shui Liu, Jiun-Rong Pai, Shou-Wen Kuo | 2020-11-17 |
| 10714364 | Apparatus and method for inspecting wafer carriers | Cheng-Kang Hu, Shou-Wen Kuo, Jiun-Rong Pai, Hsu-Shui Liu | 2020-07-14 |
| 10569520 | Wafer debonding system and method | Chang-Chen Tsao, Kuo-Liang Lu, Ru-Liang Lee, Yu-Hung Cheng, Yeur-Luen Tu +1 more | 2020-02-25 |